John Elie Sader: search on Z-Library

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1

Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope

Sader, John Elie

Journal:

Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 521 KB

english, 1998

2

Accurate Analytic Formulae for the Far Field Effective Potential and Surface Charge Density of a Uniformly Charged Sphere

John Elie Sader

Journal:

Journal of Colloid and Interface Science

Year:

1997

Language:

english

File:

PDF, 127 KB

english, 1997

3

Mass spectrometry using nanomechanical systems: beyond the point-mass approximation

Sader, John Elie, Hanay, Mehmet Selim, Neumann, Adam, Roukes, Michael Lee

Journal:

Year:

2018

Language:

english

File:

PDF, 1.05 MB

english, 2018

4

Theoretical analysis of the static deflection of plates for atomic force microscope applications

Sader, John Elie, White, Lee

Journal:

Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 1.20 MB

english, 1993

5

The automation of robust interatomic-force measurements

Sader, John Elie

Journal:

Review of Scientific Instruments

Year:

2020

File:

PDF, 1.45 MB

2020

6

[IEEE 2014 IEEE Sensors - Valencia, Spain (2014.11.2-2014.11.5)] IEEE SENSORS 2014 Proceedings - Fluid-structure interactions of mechanical sensors at nanometer scales

Sader, John Elie

Year:

2014

Language:

english

File:

PDF, 2.15 MB

english, 2014

7

Parallel beam approximation for V-shaped atomic force microscope cantilevers

Sader, John Elie

Journal:

Review of Scientific Instruments

Year:

1995

Language:

english

File:

PDF, 832 KB

english, 1995

8

When Can the Elastic Properties of Simple Liquids Be Probed Using High Frequency Nanoparticle Vibrations?

Chakraborty, Debadi, Hartland, Gregory V, Pelton, Matthew, Sader, John Elie

Journal:

The Journal of Physical Chemistry C

Year:

2017

Language:

english

File:

PDF, 957 KB

english, 2017

9

Surface stress induced deflections of cantilever plates with applications to the atomic force microscope: Rectangular plates

Sader, John Elie

Journal:

Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 466 KB

english, 2001

10

What is the oscillation amplitude of a vibrating cantilever?

Sader, John Elie

Journal:

Review of Scientific Instruments

Year:

2019

Language:

english

File:

PDF, 941 KB

english, 2019

11

Solvent-Engineered Stress in Nanoscale Materials

Mills, Shaun, Rotella, Chiara, McCarthy, Eoin, Hill, David J., Wang, Jing Jing, Donegan, John F, Cahoon, James F., Sader, John Elie, Boland, John J

Journal:

ACS Applied Materials & Interfaces

Year:

2018

Language:

english

File:

PDF, 1.60 MB

english, 2018

12

Surface stress induced deflections of cantilever plates with applications to the atomic force microscope: V-shaped plates

Sader, John Elie

Journal:

Journal of Applied Physics

Year:

2002

Language:

english

File:

PDF, 375 KB

english, 2002

13

Analysis of arbitrarily perturbed circular profiles by implementation of integral-equation theory

Sader, John Elie

Journal:

Journal of the Optical Society of America A

Year:

1990

Language:

english

File:

PDF, 619 KB

english, 1990

14

Method for analysis of complex refractive-index-profile fibers

Sader, John Elie

Journal:

Year:

1990

Language:

english

File:

PDF, 382 KB

english, 1990

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